AND8432 - Thermal Considerations for a 4x4 mm QFN

نویسنده

  • Roger Stout
چکیده

Overview The 4x4 QFN package is becoming popular for many signal and interface applications. To enable optimal thermal performance, this package has an exposed heatsink designed to be soldered directly to a metal pad on the application board. The purpose of this article is to show how application board thermal properties dominate the typical system in which a small QFN package might be used. Therefore, external design choices will, in most cases, make the difference between what would otherwise be reasonable, plausible or impossible applications, at least when viewed from a strictly thermal perspective. In broad terms, the junction−to−back−of−flag thermal resistance of the 4x4 QFN is on the order of 6−8°C/W (the lower value being obtained when referencing the temperature at the hottest point on the board−side of the exposed mounting pad, the higher value when referencing the perimeter of the exposed pad). On the other hand, because of the small footprint of the package, board−to−ambient thermal resistance (which is controlled by board size, materials, layout, and thermal boundary conditions), can easily range from about 15°C/W up to in excess of 120°C/W. JA (junction−to−ambient, the sum of the junction−to−board contribution and the board−to−ambient contribution) thus may vary nearly an order of magnitude, from the most optimistic, thermally aggressive value of about 20°C/W, up to 130°C/W. Conceivably, even lower values could be achieved by the use of forced−convection cooling applied to external heatsinks on the back side of the application board, yet on the other hand, values much worse than 130°C/W could be realized if insufficient board area is provided for the device. The latter possibility may arise indirectly and inadvertently, for instance, if the heat−spreading area is disrupted by injudicious gaps, or if other heat sources exist in close proximity to the device in question, effectively “stealing” some of its intended convection area.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Thermal Considerations of QFN and Other Exposed-Paddle Packages

Note: This application note is a summary and compilation of information based on the references mentioned at the end of this document. This information is neither tested nor guaranteed by Maxim Integrated Products. Individuals should examine the published references for details about the source and test procedures used to obtain this information.

متن کامل

Warpage and Wire Sweep Analysis of Qfn Molded Array Strip Using Modeling and Experimental Methods

In this paper, both experimental and modeling works were resorted to analyze the warpage and wire sweep of QFN molded strip. The effect of QFN package size was investigated to provide the relation between warpage and metal to mold compound ratio. Design guideline for optimum metal to mold compound ratio has been obtained. Nonlinear large deformation of finite element analysis has been performed...

متن کامل

Investigation of Warpage Induced on Molded Strip of Qfn Package

Warpage is known to be one of the primary molding issues during assembly of QFN package. It affects the package sawing process, and cause reliability issues. The main cause of warpage of area array packages is the coefficient thermal expansion (CTE) mismatch between the moulding compound and other components inside the package. The objective of this study is to investigate the warpage induced o...

متن کامل

Solder Joint Reliability Analysis and Testing

QFN packages have become mainstream designs for mobile applications. As more applications adopt the QFN style packages, I/O count requirements are increasing. The typical method for increasing pin count in a QFN package is to increase the body size to accommodate the additional lead fingers. This is undesirable though, as mobile device users are pushing for smaller package sizes. By using a dua...

متن کامل

Reduction of Warpage Occurrence Stack-die Qfn through Fea and Statistical Method

In semiconductor packaging, warpage is one of the critical issues during molding stage. It is related to a thermal mismatch i.e. coefficient of thermal expansion (CTE) values and reliability of passive components in the package. Finite element method (FEM) is able to perform extensive structural analysis of quad flat no-lead (QFN) package designs once verified by experiments. 2 factorial is emp...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2009